X-ray examination apparatus and method

Details X-ray examination apparatus and method X-ray examination apparatus and method

2006-04-25

2006-04-25

Glick, Edward J. (Department: 2882)

X-ray or gamma ray systems or devices

Electronic circuit

X-ray source power supply

Reexamination Certificate

active

07035376

ABSTRACT:
An X-ray examination apparatus and method that provides fast and accurate control of the X-ray dose by combining a fast and inaccurate sensor dose signal for an X-ray sensor and a slow and accurate detector dose signal from an X-ray detector. The combination of the signals takes into account the delay between the two signals so that they are measured at essentially the same time.

REFERENCES:
patent: 4097741 (1978-06-01), Pfeiler et al.
patent: 4423521 (1983-12-01), Haendle et al.
patent: 5509044 (1996-04-01), Horbaschek
patent: 31 06 627 (1981-02-01), None

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