X-ray examination apparatus

Details X-ray examination apparatus X-ray examination apparatus

1984-10-11

1987-09-01

Howell, Janice A.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 79, 378 81, G01N 23207

Patent

active

046913343

ABSTRACT:
A detector slit for .theta. rotation in an X-ray examination apparatus utilizing the Seemann-Bohlin focusing principle is suspended on a mechanical arm which is capable of rotating about a shaft through the center of the focusing circle. The Seemann-Bohlin system is for .psi. adjustment tiltable about an axis through an irradiated area on an object to be examined. The readjustment of the detector during the .theta. rotation is controlled by a device which provides detector rotation with with a 1:2 gear wheel transmission. For automatic limitation of a .theta. path to be chosen, the detector housing comprises an abutment pin which cooperates with switching elements connected to the mechanical arm. The X-ray tube has a construction reduced length and is connected to a high-voltage source via a rotatable right-angled connector.

REFERENCES:
patent: 2829262 (1958-04-01), Hamacher
patent: 3322948 (1967-05-01), Baak et al.
patent: 3440419 (1969-04-01), Gupta et al.
patent: 3852594 (1974-12-01), Paolini
patent: 4128762 (1978-12-01), Nagao et al.
IBM Technical Disclosure Bulletin, vol. 11, No. 12, May 1969, pp. 1728-1729, B. S. Berry and R. Feder, "X-Ray Diffractometer for Thin Films".

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