X-ray diffractometer sample holder

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

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Details

378 79, 378208, G01N 23207

Patent

active

050849107

ABSTRACT:
The present invention relates to a sample holder to be used with an x-ray powder diffractometer. One of the novel features resides in the fact that the sample holder is made of single crystal silicon grown in the [100] direction. This sample holder may have a cavity therein for holding a powder sample.

REFERENCES:
patent: 2495173 (1950-01-01), Leape
patent: 3148275 (1964-09-01), Mack
patent: 3307036 (1967-02-01), Bouvelle
patent: 4078175 (1978-03-01), Fletcher et al.

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