X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1990-12-17
1992-01-28
Howell, Janice A.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 79, 378208, G01N 23207
Patent
active
050849107
ABSTRACT:
The present invention relates to a sample holder to be used with an x-ray powder diffractometer. One of the novel features resides in the fact that the sample holder is made of single crystal silicon grown in the [100] direction. This sample holder may have a cavity therein for holding a powder sample.
REFERENCES:
patent: 2495173 (1950-01-01), Leape
patent: 3148275 (1964-09-01), Mack
patent: 3307036 (1967-02-01), Bouvelle
patent: 4078175 (1978-03-01), Fletcher et al.
Albe William R.
Li Chi-Tang
Dow Corning Corporation
Gobrogge Roger E.
Howell Janice A.
Porta David P.
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