X-ray diffractometer for high flux grazing incidence...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Reexamination Certificate

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C378S079000, C378S081000

Reexamination Certificate

active

07085349

ABSTRACT:
An X-ray diffractometer (1) comprising an X-ray source (2) emitting a line focus X-ray beam (3; 11) wherein the larger extension of the beam cross section defines a line direction (4; 12) of the X-ray beam (3; 11), further comprising a sample (6; 13), and an X-ray detector (7) rotatable in a scattering plane around an axis ω intersecting the position of the sample (7) is characterized in that the X-ray source is mounted to a switching device (10), which allows to move the X-ray source into one of two fixed positions with respect to the scattering plane, wherein in the first position the line direction (4) of the X-ray beam (3) is parallel to the scattering plane and in the second position the line direction (12) of the X-ray beam (11) is perpendicular to the scattering plane, and wherein the path of the X-ray beam (3, 11) in the two fixed positions of the X-ray source is the same. This X-ray diffractometer has a simple mechanical setup and allows in plane grazing incidence diffraction as well as regular XRD measurements with good resolution.

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“Advanced Thin film X-ray system-Grazing incidence in-plane diffractometer”. The Rigaku Journal, vol. 16, No. 1 (1999).
Sakata, O. et al. “Ultrahigh-vacuum facility for high- resolution grazing-angle x-ray diffraction at a vertical wiggler source of synchrotron radiation.” J. of Synch. Rad., Jul. 1, 1998, Munksgaard, Denmark.
Daillant J. et al. “High-Resolution X-ray scattering Experiments: I. Surfaces”, Rep. Prog. Phys., vol. 63, 2000, pp. 1725-1777.

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