X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1991-07-22
1993-03-16
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
379 79, 379158, G01N 23207
Patent
active
051951150
ABSTRACT:
The invention relates to an X-ray diffractometer device, comprising an X-ray source, a collimator device for the source, a sample support, a collimator device for the beam reflected by the sample and a counter producing an output signal in the form of a voltage which is proportional to the number of photons reflected by the sample. This device furthermore includes a motor drive for the sample support, recording means for the signal Y originating from the proportional counter as a function of the angle .theta. between the plane of incidence of the sample and the incident beam, denoted X, mechanical means having a support for a plurality of filters having different coefficients of absorption and including a motor drive for this filter support, data processing means for selecting one of the filters of the filter support and for controlling the motor drive of the sample support, the motor drive of the filter support and the recording means, respectively.
REFERENCES:
patent: 3030512 (1962-04-01), Harker
patent: 5003569 (1991-03-01), Okada et al.
Schiller Claude
Weber Jean-Pierre
Botjer William L.
Porta David P.
U.S. Philips Corp.
LandOfFree
X-ray diffractometer device and use of this device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with X-ray diffractometer device and use of this device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray diffractometer device and use of this device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-356466