X-ray diffraction measuring apparatus having debye-scherrer...

Details X-ray diffraction measuring apparatus having debye-scherrer... X-ray diffraction measuring apparatus having debye-scherrer...

2008-09-26

2010-12-28

Yun, Jurie (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S071000

Reexamination Certificate

active

07860217

ABSTRACT:
An X-ray diffraction measuring apparatus equipped with Debye-Scherrer optical system therein, comprises a generator for generating a characteristic X-ray to be irradiated upon a sample to be measured; an X-ray detector being disposed to surround that sample around; and a focusing arrangement, being disposed between the sample and the X-ray detector, for collecting an X-ray scattering from the sample covering over a predetermined angle, in a peripheral direction, around the sample, and for focusing and irradiating it upon the X-ray detector.

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