X-ray diffraction inspection system

Details X-ray diffraction inspection system X-ray diffraction inspection system

1988-08-03

1991-04-09

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 57, G01N 23201

Patent

active

050070720

ABSTRACT:
An inspection system for detecting the presence of selected crystalline materials, such as explosives or drugs, utilizing an x-ray source and a collimated array of detectors to sense radiation scattered by the objects being inspected. A signal processing system compares the measured signal with selected spectra to determine whether specific materials are present within the inspected object.

REFERENCES:
patent: Re28544 (1975-09-01), Stein et al.
patent: 3428802 (1969-02-01), Mehta et al.
patent: 3440419 (1969-04-01), Das Gupta et al.
patent: 3596092 (1971-07-01), Marjoram
patent: 3759383 (1973-09-01), Inoue
patent: 3895232 (1975-07-01), Schneeberger
patent: 3980889 (1976-09-01), Haas et al.
patent: 4020346 (1977-04-01), Dennis
patent: 4031545 (1977-06-01), Stein et al.
patent: 4131794 (1978-12-01), Bruninx
patent: 4228357 (1980-10-01), Annis
patent: 4260898 (1981-04-01), Annis
patent: 4303860 (1981-12-01), Bjorkholm et al.
patent: 4342914 (1982-08-01), Bjorkholm
patent: 4357535 (1982-11-01), Haas
patent: 4389729 (1983-06-01), Stein
patent: 4430568 (1984-02-01), Yoshida et al.
patent: 4454605 (1984-06-01), DeLucia
patent: 4511799 (1985-04-01), Bjorkholm
patent: 4691332 (1987-09-01), Burstein et al.
patent: 4715053 (1987-12-01), Comstock et al.
patent: 4751722 (1988-06-01), Harding et al.
patent: 4799247 (1989-01-01), Annis et al.
J. Opt. Soc. Am. A; "Status and Outlook of Coherent X-Ray Scatter Imaging"; G. Harding and J. Kosanetzky; vol. 4, No. 5; May 1987; pp. 933-944.
Newsweek; "Detecting Concealed Weapons"; Jun. 23, 1986; p. 3.
American Science and Engineering, Inc.; "Z Technology".
"Heimann HI-SCAN X-Ray Scanning Systems the Best Solution to Increase the Efficiency of Your Security Force"; 4 pages.

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