X-ray diffraction equipment for X-ray scattering

Details X-ray diffraction equipment for X-ray scattering X-ray diffraction equipment for X-ray scattering

2008-01-15

2009-06-02

Thomas, Courtney (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S071000

Reexamination Certificate

active

07542547

ABSTRACT:
An X-ray scattering chamber12includes a housing14that may be mounted in X-ray diffraction equipment between an X-ray source2and an X-ray detector4,for example on goniometer arm6. The housing14includes sample holder16and beam conditioning optics22,24, but the system also makes use of primary optics10outside the housing. The equipment is suitable for SAXS and/or SAXS-WAXS.

REFERENCES:
patent: 4263510 (1981-04-01), Ciccarelli et al.
patent: 2004/0028179 (2004-02-01), Rosso et al.
patent: WO 00/23795 (2000-04-01), None
patent: WO 01/44793 (2001-06-01), None
European Patent Office, European Search Report—Application No. EP 07 10 0858, dated Aug. 16, 2007, 5 pages.
Ladell, J. et al., “Cu Ka2Elimination Algorithm,” J. Appl. Cryst. 8, 499-506 (1975).

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