X-Ray diffraction camera

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Patent

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Details

378 81, G01N 23205, G01N 23207

Patent

active

045731829

ABSTRACT:
An X-ray diffraction camera which rotates a sample about two generally normal axes while simultaneously rotating the sample about a third axis which changes in angular relationship relative to the two normal axes, said camera further providing linear reciprocation of the sample along said third axis.

REFERENCES:
patent: 2317329 (1943-04-01), McLachlan
patent: 4413354 (1983-11-01), Manners

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