X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1984-03-28
1986-02-25
Smith, Alfred E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 81, G01N 23205, G01N 23207
Patent
active
045731829
ABSTRACT:
An X-ray diffraction camera which rotates a sample about two generally normal axes while simultaneously rotating the sample about a third axis which changes in angular relationship relative to the two normal axes, said camera further providing linear reciprocation of the sample along said third axis.
REFERENCES:
patent: 2317329 (1943-04-01), McLachlan
patent: 4413354 (1983-11-01), Manners
Grigsby T. N.
Smith Alfred E.
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