X-ray diffraction apparatus and method

Details X-ray diffraction apparatus and method X-ray diffraction apparatus and method

2007-07-10

2007-07-10

Glick, Edward J. (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S089000

Reexamination Certificate

active

10511571

ABSTRACT:
A high resolution X-ray diffraction apparatus includes a source4of X-rays and a slit6to direct a collimated beam of X-rays11onto a sample16on a sample stage8.Detector10records the intensity of diffracted X-rays as a function of position along its length. The geometry allows high resolution without the use of a monochromator.

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patent: 2001-141674 (2001-05-01), None
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