X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2007-01-02
2007-01-02
Glick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S147000
Reexamination Certificate
active
10442914
ABSTRACT:
An x-ray diffraction apparatus comprises an x-ray source for generating an x-ray beam, a monochromator for generating a monochromatic x-ray beam from the x-ray beam, and a collimator for collimating the monochromatic x-ray beam and directing it onto a sample, wherein the x-ray source and the monochromator are pre-assembled and fixed with respect to each other in an integrated unit such that in use the path length of the x-ray beam from the source to the monochromator is maintained substantially constant. X-ray flux at the sample is further enhanced by use of a partial monocapillary collimator arranged to direct part of the X-ray beam to the sample by a single grazing reflection.
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Artman Thomas R.
Glick Edward J.
Kenyon & Kenyon LLP
Oxford Diffraction Limited
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