X-Ray diffraction apparatus

Details X-Ray diffraction apparatus X-Ray diffraction apparatus

1981-08-27

1984-01-17

Gensler, Paul L.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 86, G01N 2320

Patent

active

044267185

ABSTRACT:
The X-ray diffraction apparatus of the invention includes means capable of detecting the position and intensity distribution of the diffracted X-ray with respect to a thin bundle X-ray and means for moving the former means to a position at which the former means is capable of detecting the diffracted X-ray, and makes it possible to reliably and easily carry out rough detection of the position of the diffracted X-ray and fine detection of the intensity distribution of the diffracted X-ray without increasing the size of the diffracted X-ray detecting means.

REFERENCES:
patent: 3596092 (1971-07-01), Marjoram
patent: 3868506 (1975-02-01), Ogiso

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