X-ray diagnostic system

Details X-ray diagnostic system X-ray diagnostic system

1998-04-22

2000-07-25

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 85, 378 87, 378 88, 378 45, 378145, G21K 106

Patent

active

060944714

ABSTRACT:
X-ray diagnostic system. The system includes a source of x-rays which communicates with an x-ray beam concentrator spaced apart from the x-ray source and disposed for receiving x-rays from the x-ray source. An x-ray spectrometer is disposed for receiving x-rays from the concentrator. In a preferred embodiment, the concentrator is formed of a cylindrical spiral of a metal-coated plastic material having a surface for reflecting x-rays. In another embodiment, the concentrator includes a plurality of concentric nested cylinders of a metal-coated plastic material for reflecting x-rays. In yet another embodiment, the concentrator is a glass capillary bundle. The concentrator allows the spectrometer to be spaced away from the source of x-rays such as scanning electron microscope.

REFERENCES:
patent: 4525853 (1985-06-01), Keem et al.
patent: 5497008 (1996-03-01), Kumakhov
patent: 5812631 (1998-09-01), Yan et al.
patent: 5912940 (1999-06-01), O'Hara

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