X-ray diagnostic apparatus for analyzing scattered X-rays by usi

X-ray or gamma ray systems or devices – Electronic circuit – Exposure timer

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148149, 148154, 148155, G21K 104, H05G 164

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active

047410094

ABSTRACT:
An X-ray diagnostic apparatus analyzes scattered X-ray distribution from total X-ray transmission data by employing an X-ray shield member. One of plural X-ray shield members is selected based on the X-ray magnifying factor of a region of interest (ROI) in a patient. The scattered X-ray distribution I.sub.sc (x,y) over the entire X-ray projection area is calculated by utilizing a method of linear interpolation and the actually measured scattered X-ray components.

REFERENCES:
patent: 4399457 (1983-08-01), Riederer et al.
patent: 4549307 (1985-10-01), Macovski
patent: 4550419 (1985-10-01), Aichinger et al.
patent: 4656650 (1987-04-01), Kikuchi et al.

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