X-ray detectors

Details X-ray detectors X-ray detectors

1988-07-20

1990-06-05

Berman, Jack I.

Radiant energy

With charged particle beam deflection or focussing

With detector

25037015, 357 83, 62 511, 62 555, H01J 37244

Patent

active

049316508

ABSTRACT:
A technique for conditioning X-ray detectors which are introduced into electron microscopes and maintained at an operating temperature substantially below ambient is disclosed. Localized heating is applied to the detector by, for example, electrical resistance heating, whereby the detector is conditioned for about an hour without the heat sink being removed.

REFERENCES:
patent: 3864570 (1975-02-01), Zingaro
patent: 4707998 (1987-11-01), Linner et al.
Wirmark, G., et al., "Characterisation of Si (Li) X-Ray Detector Efficiencies in the Low Energy Range", presented at the 11th International Congress on Electron Microscopy, Aug. 1986.
Fiori, C. E. et al., Operation of Energy-Dispersive X-Ray Spectrometers in the Analytical Electron Microscope, Analytical Electron Microscopy, 1981, Geiss, R. H., Ed.
Link Analytical Brochure entitled "High Performance Detector Technology", designated DT/688/10M.

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