X-ray or gamma ray systems or devices – Beam control – Antiscatter grid
Reexamination Certificate
2005-01-25
2005-01-25
Glick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Beam control
Antiscatter grid
C378S145000, C430S004000
Reexamination Certificate
active
06847701
ABSTRACT:
In an X-ray detector and method for applying a stray radiation grid onto an X-ray detector having detector elements arranged in a matrix that form a detector surface having detection regions sensitive to X-rays and less sensitive intermediate regions, a basic structure for the stray radiation grid is built up over the detector surface directly on the X-ray detector with a rapid prototyping technique and is subsequently coated or filled with a material that is highly absorbent for X-radiation. An absorbent structure thus arises that lies over the less sensitive intermediate regions of the detector surface. Moiré disturbances are avoided in the X-ray image exposure and the detective quantum efficiency (DQE) is increased.
REFERENCES:
patent: 6021173 (2000-02-01), Brauers et al.
patent: 6778632 (2004-08-01), Hoheisel et al.
Hoheisel Martin
Skleritz Hartmut
Glick Edward J.
Schiff & Hardin LLP
Siemens Aktiengesellschaft
Thomas Courtney
LandOfFree
X-ray detector with an applied stray radiation grid, and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with X-ray detector with an applied stray radiation grid, and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray detector with an applied stray radiation grid, and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3432282