X-ray detector system having low Z material panel

Details X-ray detector system having low Z material panel X-ray detector system having low Z material panel

2006-09-19

2006-09-19

Wells, Kenneth B. (Department: 2816)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S057000, C378S062000

Reexamination Certificate

active

07110493

ABSTRACT:
A method and apparatus for detecting concealed items on or in an object by utilizing a low Z material panel. The object to be scanned is located between an x-ray detector and the low Z material panel. The method includes producing a pencil beam of x-rays from an x-ray source directed toward the object, scanning the beam of x-rays over the object, and detecting x-rays scattered from the beam of x-rays as a result of interacting with the object and the low Z material panel. The apparatus includes an x-ray source to produce a pencil beam of x-rays directed toward the object, a scanner to scan the beam of x-rays over the object, and the detector to detect x-rays scattered from the beam of x-rays as a result of interacting with the object and the low Z material panel.

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