X-ray CT system for x-ray phase contrast and/or x-ray dark...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Reexamination Certificate

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C378S062000

Reexamination Certificate

active

07983381

ABSTRACT:
An x-ray CT system for x-ray phase contrast and/or x-ray dark field imaging has a grating interferometer that has a first grating structure that has a number of band-shaped x-ray emission maxima and minima arranged in parallel, the maxima and minima exhibiting a first grating period, a second band-shaped grating structure that produces, as a phase grating, a partial phase offset of x-ray radiation passing therethrough and that exhibits a second grating period, a third band-shaped grating structure with a third grating period with which relative phase shifts of adjacent x-rays and/or their scatter components are detected, and a device for value-based determination of the phase between adjacent x-rays and/or for value-based determination of the spatial intensity curve per detector element perpendicular to the bands of the grating structures. The third grating structure has a grating period that is larger by a factor of 2 to 5 than the grating period of the first grating structure.

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patent: WO 2007/125833 (2007-04-01), None
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“Biomedical Imaging by Talbot-Type X-Ray Phase Tomography,” Momose et al., Proc. of SPIE, vol. 6318 (2006) pp. 63180T-1—63180T-10.

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