X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2007-01-02
2007-01-02
Thomas, Courtney (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S070000, C378S071000
Reexamination Certificate
active
10939471
ABSTRACT:
An X-ray crystal orientation measuring apparatus and a method thereof, for enabling to measure distribution of crystal orientations upon a crystal having the sub-grain structure, lineage structure, other than the single domain, with using X-ray, comprises, an XY stage20for mounting a crystal S to be measured thereon and being movable in X-Y directions, an X-ray generating device50for irradiating X-ray at a predetermined angle upon a measuring surface of the crystal to be measured on the stage, a high-sensitive two-dimensional detector60for detecting the diffraction image of X-ray, which is irradiated from the X-ray generating device upon the measuring surface of the crystal to be measured, and a control PC, wherein the control PC calculates out a central position of the diffraction image detected, from the detected screen, so as to calculate out the crystal orientation upon the measuring surface of the crystal to be measured.
REFERENCES:
patent: 5588034 (1996-12-01), Bowen et al.
patent: 7001462 (2006-02-01), Genier et al.
patent: 3236109 (1983-04-01), None
patent: 2107560 (1983-04-01), None
patent: 57-136150 (1982-08-01), None
patent: 57-136151 (1982-08-01), None
patent: 3-058058 (1991-09-01), None
patent: 4-059581 (1992-09-01), None
patent: 2001-13092 (2001-01-01), None
patent: 2003-149179 (2003-05-01), None
patent: 03/076699 (2003-09-01), None
Inago Yoshio
Kikuchi Tetsuo
Uematsu Toshio
Usui Makoto
Antonelli, Terry Stout and Kraus, LLP.
Rigaku Corporation
Thomas Courtney
Yun Jurie
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