X-ray or gamma ray systems or devices – Accessory – Testing or calibration
Patent
1983-09-27
1985-03-19
Smith, Alfred E.
X-ray or gamma ray systems or devices
Accessory
Testing or calibration
2502521, 378138, G01T 116
Patent
active
045063753
ABSTRACT:
A method and apparatus for the radiometric calibration of an X-ray detector, such as a spectrometer, for wavelengths in the range of 2 to 200 angstroms. A hot filament X-ray diode for generating a point source of X-rays is disposed within a vacuum manifold and is surrounded by a housing having two ports equally spaced from the point source. A center line of each port passing through the point source forms substantially the same angle with respect to the line defined by the stream of electrons passing from the cathode to the anode of the X-ray diode so that the apparent intensity of the point source through each port is substantially identical. A reference detector is placed opposite one port to intercept a known portion of an X-ray beam emitted therefrom, while the detector to be calibrated is placed opposite the other port for interception of a known portion of an X-ray beam passing through that port. The X-ray diode includes an anode which is provided with a replaceable cap for control of the wavelength of radiation emitted. The output generated in the reference detector is used for calibration of the detector to be calibrated.
REFERENCES:
patent: 2399650 (1946-05-01), Moyer
patent: 2503062 (1950-04-01), Moriarty
patent: 2812462 (1957-11-01), Maltby et al.
patent: 3107311 (1963-10-01), Gray
Grigsby T. N.
Smith Alfred E.
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