X-ray calibration

Details X-ray calibration X-ray calibration

2009-11-25

2011-12-13

Song, Hoon (Department: 2882)

X-ray or gamma ray systems or devices

Accessory

Testing or calibration

C378S205000

Reexamination Certificate

active

08075184

ABSTRACT:
Methods, devices, and kits for determining the magnification of an x-ray image of an object, or a portion of an object are described. An exemplary method comprises the steps of providing an object to be x-rayed, providing a first posterior x-ray marker having a pre-determined dimension, providing anteriorly to the object to be x-rayed, a second x-ray marker having predetermined dimensions, recording an x-ray image of the object, the first posterior x-ray marker, and second x-ray markers, and comparing a dimension of the first posterior x-ray marker recorded on the x-ray image, and a dimension of the second x-ray marker recorded on the image to a pre-determined value for the object x-rayed, to estimate a magnification of the x-ray image of the object.

REFERENCES:
patent: 5970119 (1999-10-01), Hofmann
patent: 6459772 (2002-10-01), Wiedenhoeffer
patent: 6473489 (2002-10-01), Bani-Hashemi et al.
patent: 2004/0252811 (2004-12-01), Morita
patent: 2006/0115054 (2006-06-01), Yatsenko
patent: 2009/0268865 (2009-10-01), Ren et al.
patent: 1880672 (2008-01-01), None
patent: WO2008016796 (2008-02-01), None

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