X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent
1993-04-30
1995-03-14
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Fluorescence
378 81, 378146, 378145, G01N 23223
Patent
active
053982738
ABSTRACT:
A displacement measuring system includes means for focusing x-rays into a narrow, intense beam which can be used to excite targets that fluoresce secondary x-rays. By precisely measuring the focused image position as the focused image is caused to overlap the fluorescing target, relevant changes in target position can be determined. The x-rays are focused using a novel Johansson ground and bent crystal which, along with the x-ray tube, is mounted on a common base for lineal scanning. This common base preferably comprises a linear translation table. By scanning the beam onto fluorescing targets, edge detection can be accomplished by monitoring subsequent x-ray fluorescing using an appropriate detector whose output is measured and recorded. In a preferred embodiment, the detector is formed integral with an enclosure for enclosing the x-ray tube and bent crystal on the linear translation table. By comparing beam position with detector output, an exact measurement of target edge position with respect to that of the crystal can be achieved. If the target is then translated and the scan repeated, a precise measurement of its displacement can be made. If two targets are used with one or more beams, strain measurement between the targets can be accomplished.
REFERENCES:
patent: 4577337 (1986-03-01), Light
patent: 5220591 (1993-06-01), Ohsugi et al.
High Temperature Displacement Measurement Using a Scanning Focussed X-Ray Line Source: Jordan et al Advances in X-Ray Analysis, Jun. 1991.
X-Ray Based Displacement Measurement for Hostile Environments: Canistraro et al "NASA Technical Memo 105551" Mar. 1992.
X-Ray Beam Method for Displacement Measurement in Hostile Environments and Strain Measurements Conference: E. H. Jordan et al, Nov. 1989.
Canistraro Howard A.
Jordan Eric H.
Pease Douglas M.
Porta David P.
The University Of Connecticut
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