X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2008-01-30
2009-11-17
Kao, Chih-Cheng G (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
Reexamination Certificate
active
07620150
ABSTRACT:
The apparatus has an x-ray source that emits an x-ray cone beam through a tubular, x-ray-blocking guide to a planar template with a small pinhole to produce a pencil beam. The template is movable so the pencil beam can scan the target region to be imaged. Between the template and target region is an x-ray detector assembly with a plastic scintillator. The scintillator has an opening about the same size and shape as the target region that allows the pencil beam to pass to the target region. Photo-multiplier detectors receive the light generated by the backscattered x-rays in the scintillator. The method of the present invention employs the apparatus. Multiple x-rays source locations permit the generation of 3D images.
REFERENCES:
patent: 5692029 (1997-11-01), Husseiny et al.
patent: 2004/0028178 (2004-02-01), Jupp et al.
patent: 2007/0098142 (2007-05-01), Rothschild et al.
Altman & Martin
Kao Chih-Cheng G
Martin Steven K
LandOfFree
X-ray backscatter system for imaging at shallow depths does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with X-ray backscatter system for imaging at shallow depths, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray backscatter system for imaging at shallow depths will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4143923