X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1995-05-31
1998-02-10
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 2, G01N 2320
Patent
active
057177333
ABSTRACT:
A method and device for examining the internal structure of an object uses diffracted X-rays or other penetrating radiation. In one embodiment, spatial filters proximate to a source of radiation transmit an array of divergent pixel-beams which irradiate an object being examined. The object absorbs, refracts, diffracts, and incoherently scatters radiation from the pixel-beams. Spatial filters proximate to a detector block undeflected and refracted radiation which exits the object. The detector separately measures diffracted radiation for each pixel-beam. For example, an integral of the diffracted intensity around a pixel-beam provides a pixel intensity in an image of the object. Alternatively, analyzing the intensity in a diffraction pattern around a pixel-beam can identify structures and materials within the object. A non-invasive procedure identifies abnormal tissue by measuring radiation diffracted at an angle characteristic of the diffraction pattern for abnormal tissue. In one embodiment of the invention, two spatial filters which form the pixel-beams have arrays of apertures with apertures in the first and second filters along lines from the source. This allow the pixel-beams to be divergent and increases the percentage of usable radiation from the source.
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Kurbatov Alexey V.
Lazarev Pavel I.
Church Craig E.
Millers David T.
Quanta Vision, Inc.
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