X-ray analyzer

Details X-ray analyzer X-ray analyzer

2005-11-22

2005-11-22

Church, Craig E. (Department: 2882)

X-ray or gamma ray systems or devices

Beam control

Filter

C378S053000

Reexamination Certificate

active

06968043

ABSTRACT:
There is disclosed an X-ray analyzer capable of precisely measuring a trace amount of cadmium contained in plastic. The analyzer has an X-ray filter assembly between an X-ray tube having an Rh target and a plastic sample. The filter assembly consists of first, second, and third X-ray filters which are made of zirconium, copper, and molybdenum, respectively. The first through third X-ray filters have thicknesses of about 100 μm, 200 μm, and 40 μm, respectively.

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patent: 6418193 (2002-07-01), Albagli
patent: 2004/0240606 (2004-12-01), Laurila et al.
patent: 2004/0264647 (2004-12-01), Graf et al.
patent: 19832973 (2000-01-01), None
Bertin, Eugene P. “Introduction to X-ray Spectrometric Analysis” Plenum Press, New York 1978, pp. 53,87,93-94.

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