X-ray analysis system with humidified sample

Details X-ray analysis system with humidified sample X-ray analysis system with humidified sample

2005-05-24

2005-05-24

Bushey, Scott (Department: 1724)

Gas and liquid contact apparatus

With external supply or removal of heat

Processes

C261S063000, C261S104000, C261S129000, C261S133000, C261S154000, C378S080000

Reexamination Certificate

active

06896247

ABSTRACT:
An X-ray analysis system controls the humidity of a sample. The analysis system has a device for dividing a gas flow stream into two portions and for submerging a membrane humidifier tube, containing one of the gas flows, in a water bath in which the gas passing through that tube is moisturized to a desired degree. The two gas flows are subsequently reunited at a controlled temperature to provide for combined moisturized gas at a desired temperature and humidity. The gas is then sprayed onto the sample and an excess moisturized gas vented from the chamber to maintain a moisturize gas sample without condensation of water on or near the sample. This system and a method for its use allow measurements of samples to be made as a function of humidity and temperature over wide ranges of these parameters under highly stable conditions in a straightforward manner which are not susceptible to malfunction and which can be produced and operated at low cost.

REFERENCES:
patent: 3532270 (1970-10-01), Schoen Jr.
patent: 3735559 (1973-05-01), Salemme
patent: 4263510 (1981-04-01), Ciccarelli et al.
patent: 4821303 (1989-04-01), Fawcett et al.
patent: 5390230 (1995-02-01), Chang
patent: 6748048 (2004-06-01), Dosho

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