X-ray analysis apparatus comprising a saggitally curved analysis

Details X-ray analysis apparatus comprising a saggitally curved analysis X-ray analysis apparatus comprising a saggitally curved analysis

1990-01-29

1991-04-16

Westin, Edward P.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 82, 378 83, 378 85, 378 45, 378 49, G01T 136, G21K 23201, G21K 106, G01N 23223

Patent

active

050089102

ABSTRACT:
An X-ray analysis apparatus comprises an analysis crystal which is cylindrically curved in the saggital direction. As a result, a beam diffracted by the crystal is collimated in that direction, i.e. the plane of incidence of the X-ray beam, so that a substantial gain regarding radiation yield is obtained without loss of resolution.

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Chen, C. T., Concept and Design Procedure for Cylindrical Element Monochromators for Synchrotron Radiation, Nuclear Instrument, and Methods in Physics Research, A256 (1987), pp. 595-604.
Yaakohi et al., Focusing X-Ray Spectrograph for Laser Fusion Experiments, Rev. Sci. Instrum., 50(12), Dec. 1979, pp. 1609-1611.

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