X-ray analysis apparatus and method

Details X-ray analysis apparatus and method X-ray analysis apparatus and method

2005-11-15

2005-11-15

Glick, Edward J. (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Fluorescence

C378S145000, C250S505100

Reexamination Certificate

active

06965663

ABSTRACT:
This invention provides an X-ray analysis apparatus and method capable of simply and accurately determining the position of analysis in a sample from an optical image of it without lowering the sensitivity and/or the spatial resolution in light element analysis. The X-ray analysis apparatus of the present invention irradiates a sample with X-rays narrowed down by means of an X-ray guide member from above the sample in which said sample is directly irradiated with X-rays from said X-ray guide member and an optical image of said sample is obtained in the direction coaxial with said X-ray guide member.

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patent: 5896438 (1999-04-01), Miyake et al.
patent: 60-144646 (1985-07-01), None
patent: 60-253956 (1985-12-01), None
patent: 60253956 (1985-12-01), None

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