X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1993-04-26
1994-09-06
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 91, 378116, A61B 600
Patent
active
053454910
ABSTRACT:
Pulses generated by an x-ray gas ionisation detector have different temporal forms in dependence of the location in the detector where an x-ray photon interacts with a gas atom. The energy-resolution at count rates amounting to Mcts.sup.-1 of an x-ray analysis apparatus is improved by employing a resetable pulse-integrator. A resetable integrator is constructed by employing a dual gate field-effect transistor (FET) and a wide-band current feedback operational amplifier. Cross-talk due to parasitic capacitances is reduced by supplying a suitable DC voltage to one of the two gates of the dual gate FET. The gate control is made independent of the output of the integrator.
REFERENCES:
patent: 4334154 (1982-06-01), Sandland
patent: 4654531 (1987-03-01), Morris et al.
patent: 4815118 (1989-03-01), Acharya et al.
patent: 4922442 (1990-05-01), Bolk et al.
patent: 5012498 (1991-04-01), Cuzin et al.
Bolk Hendrick J. J.
Zieltjens Georges C. P.
Porta David P.
Slobod Jack D.
U.S. Philips Corporation
Wong Don
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