X-ray analysis apparatus

Details X-ray analysis apparatus X-ray analysis apparatus

2007-04-17

2007-04-17

Glick, Edward J. (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S070000, C378S162000

Reexamination Certificate

active

11066142

ABSTRACT:
An X-ray analysis apparatus includes: an X-ray radiation unit that irradiates a sample with X-ray; an X-ray detection unit that detects X-ray emission from the sample; a unit that allows the X-ray detection unit to perform scanning operation for changing the angle of the X-ray detection unit with respect to the sample; and an image controller that displays information related to X-ray intensity detected by the X-ray detection unit and information related to a scanning angle of the X-ray detection unit as a 3D image. The image controller displays the 3D image simultaneously with the scanning operation of the X-ray detection unit. Further, simultaneously with the scanning operation of the X-ray detection unit, two or all of 1D, 2D, and 3D images are displayed in one screen. A measurement result starts being displayed as a 3D image before information related to all measurement results has been obtained.

REFERENCES:
patent: 2005/0099423 (2005-05-01), Brauss
patent: 2006/0078195 (2006-04-01), Vaillant et al.
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patent: 2000-258366 (2000-09-01), None
patent: 2004-28686 (2004-01-01), None

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