X-ray analysis apparatus

Details X-ray analysis apparatus X-ray analysis apparatus

2006-12-05

2006-12-05

Glick, Edward J. (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S070000, C378S081000, C378S098800

Reexamination Certificate

active

07145983

ABSTRACT:
An X-ray analysis apparatus is disclosed, in which X-rays emitted from an X-ray source are applied to a sample and a two-dimensional CCD sensor detects the X-rays diffracted by the sample. The X-ray analysis apparatus has a 2θ-rotation drive and a program. The 2θ-rotation drive moves the two-dimensional CCD sensor. The program is executed to control the motion of the CCD sensor. The 2θ-rotation drive rotates the CCD sensor around ω-axis that extends over the surface of the sample. The program synchronizes the transfer of charges in the CCD sensor with the motion of the CCD sensor driven by the 2θ-rotation drive. Hence, data items for the same diffraction angle can be accumulated in the pixels of the two-dimensional CCD sensor. This achieves high-speed and high-sensitivity in detection of diffracted X-rays.

REFERENCES:
patent: 5742658 (1998-04-01), Tiffin et al.
patent: 6198796 (2001-03-01), Yokoyama et al.
patent: 2002/0053641 (2002-05-01), Verbruggen
patent: 2005/0084065 (2005-04-01), Taguchi
patent: 0 997 779 (2000-05-01), None
patent: 2002-250705 (2002-09-01), None

Affiliated with

Also associated with

Rating

X-ray analysis apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with X-ray analysis apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray analysis apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3703126