X-ray analysis apparatus

Details X-ray analysis apparatus X-ray analysis apparatus

2002-08-08

2004-11-30

Church, Craig E. (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Fluorescence

C378S079000, C378S208000

Reexamination Certificate

active

06826253

ABSTRACT:

This application claims Paris Convention priority of DE 101 43 991.1 filed Sep. 7, 2001 the complete disclosure of which is hereby incorporated by reference.
BACKGROUND OF THE INVENTION
The invention concerns an X-ray analysis apparatus for investigating material samples having a device for automatic exchange of the samples which contains a sample table with depositing positions disposed in m lines, wherein the lines extend parallel to an x direction and m≧2, and with a gripping device for precise removal of any desired sample from a depositing position and transferral into a transfer and/or measuring position and back to a depositing position, wherein the gripping device can be linearly displaced parallel to the x direction.
An X-ray analysis apparatus of this type is known e.g. from the company leaflet “SPECTROMETRY SOLUTIONS; S4 EXPLORER”, Bruker AXS Analytical X-Ray Systems GmbH, 2001.
This document describes in detail the functional principles of an arrangement of this type. Such X-ray analysis apparatus are suited for rapid, routine, and non-destructive analyses of the most different of sample material in laboratories and research institutes. X-ray fluorescence, X-ray diffractometry, or other X-ray analysis methods can be used for examining the material samples. The material samples may be massive solid bodies, powder, or liquid samples disposed in appropriate sample containers.
Analysis devices of this type are provided for routine, rapid examination of a large number of samples. For this reason, an automatic exchange device must be provided for transporting, within the device, each of a plurality of samples to be examined. The known devices comprise a sample table for receiving the samples which is immovably fixed in the apparatus as e.g. described in the above-cited company leaflet. This sample table has openings defining an m×n matrix for inserting the different samples or sample containers. These are filled manually with the different samples according to a plan determined by the user before starting a measuring series which subsequently runs automatically without further manual influence on the part of the user.
Towards this end, the X-ray analysis apparatus comprises a gripping device for precise removal of any desired sample from one of the depositing positions, transfer into a transfer or measuring position and return back into the depositing position. To be able to address all positions on the rigid, rectangular sample table, the gripping device drive mechanism must be relatively complicated. The gripping robot must be movable in both the x and y directions. Gripping operations with the robot arm also require a substantial amount of space in the vertical z direction.
Taken together, the gripping device and the sample table, immovably mounted in the apparatus, occupy a very large, cuboid three-dimensional volume within the X-ray analysis apparatus. Since the device should also be used for routine examinations at locations where space is often quite limited, convenient use of an arrangement of this type with its associated operating elements in a typical working location is frequently problematic.
In view of the above, it is the underlying purpose of the invention to introduce an X-ray analysis apparatus with the above-mentioned features having simple topological construction which requires considerably less space due to a considerably more compact construction thereby maintaining full relative mobility of the parts, wherein accessibility to depositing, transfer and measuring positions is not less than that of the conventional device.
SUMMARY OF THE INVENTION
This object is achieved in accordance with the invention in a surprisingly simple and also effective fashion in that the sample table can be moved linearly, independently of the gripping device and parallel to a y direction extending at an angle &agr; with respect to the x direction for gripping samples from different lines, with the sample table being disposed parallel to the x-y plane.
In this manner, construction of an X-ray analysis apparatus of this type is facilitated using means which are technically easy to realize. The available space can be used much more economically and the required space in the upper region of the apparatus can be considerably reduced without having to reduce the number of sample table depositing positions which can be addressed relative to conventional devices. This is possible since the gripping robot of the inventive apparatus must no longer be moved in both the x and y directions but only in the x direction. The sample table can be linearly displaced in the y direction relative to the robot such that the gripper can address any desired depositing position.
In the inventive X-ray analysis apparatus, the angle is preferably &agr;≈90°. This minimizes the space required for the gripping device and sample table and matches them to the geometry of conventional housings.
A geometric construction of the inventive X-ray analysis apparatus is also preferred with which the x-y plane extends horizontally. This permits optimum utilization of gravity during the gripping process. Moreover, liquid samples can be easily processed without the danger of spilling.
In a particularly preferred embodiment of the inventive X-ray analysis apparatus, the depositing positions are disposed on the sample table in the form of a matrix. Selection of the depositing positions by the user is simple and the sample table can be provided with a clear arrangement of samples for inserting the samples according to a system provided by the user. Moreover, addressing of a matrix of this type by the control software for the automatic gripping device is particularly straightforward.
To facilitate operation and to stock further sample tables with samples should there be a large number of samples to be examined, the sample tables are usually constructed such that they can be easily introduced into the X-ray analysis apparatus and be detachably mounted. Several sample tables can be provided for a given apparatus, wherein only one of them is mounted in the apparatus for the next measuring sequence. As an alternative or supplement, the inventive X-ray analysis apparatus can be designed such that the samples are introduced individually via an opening from the outside to a certain location of the sample table defined as the input position and are further transported from that location by the gripping device to depositing positions predetermined by the user.
One embodiment of the inventive X-ray analysis apparatus is particularly preferred with which the device for automatic exchange of the samples is housed in a common housing with the X-ray analysis apparatus. This permits particularly advantageous utilization of the above-mentioned advantages of the reduced space required for the gripping device due to the considerably more compact arrangement as facilitated by possible separation of x and y motion.
A particularly preferred further development of this embodiment is characterized in that the common housing tapers relative to the y direction towards the top in the direction of a vertical z axis which extends perpendicular to the x-y plane, wherein the gripping device is disposed in the upper tapering part of the housing. This can only be achieved with the inventive arrangement since the inventive gripping robot is only displaced in the x and not in the y direction. The space saved in the y direction in the upper part of the device can be utilized e.g. to install a monitor which would otherwise take up valuable space at another location in the operating chamber.
A further particularly preferred embodiment of the inventive X-ray analysis apparatus is characterized in that at least some of the samples are surrounded by a sample holder in the peripheral direction, wherein the respective sample or a container holding the sample projects past the sample holder in the direction of a vertical z direction, perpendicular to the x-y plane, the gripping device being disposed on that side of the sample to surround the parts

Affiliated with

Also associated with

Rating

X-ray analysis apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with X-ray analysis apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray analysis apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3316512