X-ray analysis apparatus

Details X-ray analysis apparatus X-ray analysis apparatus

1993-11-10

1995-04-11

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Fluorescence

378 45, G01N 23223

Patent

active

054066085

ABSTRACT:
A device for performing both elemental and structural analysis of a crystalline sample, comprising a polychromatic x-ray source (11); a mounting means (15) for mounting the sample so that it is illuminated with x-rays; one or more fluorescence channels (17), able to select x-rays of a particular wavelength and energy and having means (20) for detecting said selected x-ray; a diffraction channel (28) able to select a characteristic x-ray wavelength at said source (11) following diffraction of the x-rays by said sample (14) and having means (33) for detecting a selected characteristic x-ray; and an actuating means (32) for controlling arcuate movement of said diffraction channel (28) relative to said sample (14) so as to detect x-rays leaving the sample at different diffraction angles.

REFERENCES:
patent: 3344274 (1967-09-01), Ashby et al.
patent: 3903414 (1975-09-01), Herbstein et al.
patent: 4263510 (1981-04-01), Ciccarelli et al.
patent: 5107527 (1992-04-01), Sipila et al.

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