X-ray or gamma ray systems or devices – Specific application – Absorption
Patent
1990-08-07
1992-07-21
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Absorption
378 55, 378146, G01N 2306
Patent
active
051329956
ABSTRACT:
X-ray analysis apparatus and related method including a bone densitometer apparatus, in which detectors are translatable in the plane of the fan beam for each scan line position to provide enhanced signal-to-noise ratio and resolution, and detector-to-detector normalization. In this motion, the detectors move relative to an x-ray source and an object or patient. Indexing or moving from one scan line position to the next involves relative movement between the object or patient, and the x-ray source and detectors, which are fixed in relationship to each other during this indexing.
REFERENCES:
patent: Re28544 (1975-09-01), Stein et al.
patent: 4029963 (1977-06-01), Alvarez et al.
patent: 4160167 (1979-07-01), Weiss et al.
patent: 4206363 (1980-05-01), Hounsfield et al.
patent: 4282510 (1981-08-01), Southgate
patent: 4383327 (1983-05-01), Kruger
patent: 4426721 (1984-01-01), Wang
patent: 4639941 (1987-01-01), Hounsfield
patent: 4644578 (1987-02-01), Paolini
patent: 4707786 (1987-11-01), Dehner
patent: 4736401 (1988-04-01), Donges et al.
patent: 4811373 (1989-03-01), Stein
patent: 4817119 (1989-03-01), Ledley et al.
patent: 4817123 (1989-03-01), Sones et al.
patent: 4947414 (1990-08-01), Stein
patent: 5040199 (1991-08-01), Stein
Rutt et al., "High-Speed, High-Precision Dual Photon Absorptiometry", (the University of California at San Francisco), a poster exhibited at a meeting of the American Society for Bone and Mineral Research held on Jun. 16, 1985 in Washington, D.C., 5 to 10 copied of which were provided within 2 weeks to people at their request.
Stein, "X-Ray Imaging with a Scanning Beam", Radiology, vol. 117, No. 3, pp. 713-716, Dec. 1975.
Gustafsson et al., "X-Ray spectrophotometry for bone-mineral determinations", Medical and Biological Engineering, Jan. 1974, pp. 113-118.
Hologic Inc.
Porta David P.
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