Multiplex communications – Wide area network – Packet switching
Patent
1987-02-17
1989-12-12
Orsino, Joseph A.
Multiplex communications
Wide area network
Packet switching
370 941, 340715, 340525, 34082517, H04Q 1104
Patent
active
048872601
ABSTRACT:
Provided is a channel status display for an X.25 wide area network (WAN) DTE-DCE interface. The invention, designed for use with a protocol analyzer, monitors X.25 level-2 frame traffic on the DTE-DCE link and produces a dynamic channel-activity-data-structure based upon the level-2 frames. An important class of level-2 frames are so-called I-frames. I-frames contain a 12-bit LCI (Logic Channel Identifier) field. The LCI number identifies up to 4095 channels over which network calls may be transmitted and received at the DTE-DCE interface. The LCI field of an I-frame is used to index an array of pointers. The pointers point to list members in a linked list of call-records. A call-record is a complete listing of call information for a given channel. The array of pointers and the linked list of call-records together make up the channel-activity-data-structure. The data-structure is updated with each new I-frame. The data-structure is continually mapped onto the display screen of the protocol analyzer so as to produce a Channel-Activity-Display and/or a Call-Record-Display. The Channel-Activity-Display is a matrix display showing the status of 256 DTE-DCE interface channels at once, indexed by LCI number. The viewer may page through all 4095 possible channels, viewing 256 channels at once. The Call-Record-Display is a display of the call-record for a viewer-selected channel.
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IEEE Communications Magazine, vol. 24, No. 1, Jan. 1986, pp. 16-27, IEEE, New York, US; M. H. Sherif et al.: "X.25 Conformance Testing--A Tutorial", p. 18, right-hand column; p. 24.
Nachrichten Elektronik, vol. 35, No. 12, 1981, pp. 467-471, Heidelberg, DE; G. Kafka: "X.25 Protokolltester", pp. 470-471.
Nachrichtentechnische Zeitschrift, vol. 34, No. 8, Aug. 1981, pp. 514-423, Berlin, DE; H. Gommlich: "Messtechnik an der Datenschnittstelle": p. 521, middle column, last paragraph, right-hand column.
Carden Matthew J.
Lantz Kim
Lubino Yves
Reh Theresa L.
Trytten Anne
Byrne Christopher J.
Hewlett--Packard Company
Orsino Joseph A.
Scutch III Frank M.
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