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Details

371 20, G06F 1100

Patent

active

046584005

ABSTRACT:
A test system including a data center, controller, interface, and device under test. The data center generates a test program which is applied to the device under test by the controller via the interface. The device under test includes circuitry structured for testing. The test system identifies the location of faulty elements on the device under test and stores these locations for use in a subsequent repair step.

REFERENCES:
patent: 4497056 (1985-01-01), Sugamori
patent: 4498172 (1985-02-01), Blavsar
patent: 4503537 (1985-03-01), McAnney
patent: 4513418 (1985-04-01), Bardell
patent: 4517672 (1985-05-01), Pfleiderer
patent: 4523312 (1985-06-01), Takeuchi
patent: 4534028 (1985-08-01), Trischler
patent: 4546473 (1985-10-01), Eichelberger

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