Worst case performance modeling of analog circuits

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation

Reexamination Certificate

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Details

C703S002000, C703S022000, C716S030000

Reexamination Certificate

active

06850877

ABSTRACT:
A computer system (30) and method of operating the same to model worst case performances of an analog circuit is disclosed. The computer system (30) includes disk storage devices for storing a process parameter data base (32), design of the circuit (31), and program instructions for performing the modeling method (33). Under the control of the program instructions, the system computer (22) retrieves the process parameters and desired performances, and performs a designed experiment to determine a Jacobian matrix of the dependence of the performances upon the process parameters. Singular value decomposition of the Jacobian matrix provides a set of singular values and a rotation vector, from which the coefficients of a worst case vector of the process parameters for each of the circuit performances are then derived. The system computer (22) then applies the simulation to the worst case vectors, to evaluate the worst case performances of the designed circuit.

REFERENCES:
patent: 5790436 (1998-08-01), Chen et al.
patent: 6330526 (2001-12-01), Yasuda
patent: 6356861 (2002-03-01), Singhal et al.
Krishna et al, “A Novel Methodology for Statistical Parameter Extraction,” 1995 IEEE/ACM International Conference on Computer-Aided Design, pp. 696-699 (Nov. 1995).*
M. Sengupta, et al., “Visualization of Trade-Offs in Optimization of Integrated Circuits with Multiple Objectives” IEEE, pp. 1640-1643, 1997.
M.A. Styblinski, et al., “Statistical Characterization and Optimization of Integrated Circuits Based on Singular Value Deomposition” ICECS, pp. 263-266, 1996.
M. Sengupta, et al., “An Efficient Jacobian Updating Technique for Analog Circuit Optimization” IEEE, pp. 2144-2147, 1995.
Virga, Kathleen L., et al., “Efficient Statistical Analysis of Microwave Circuit Performance Using Design of Experiments,” 1993 IEEE MTT-S Digest, pp. 123-126.
Carroll, Jim, et al., “Statistical Computer-Aided Design for Microwave Circuits,” IEEE Transactions on Microwave Theory and Techniques, No. 1, Jan. 1996, New York, US, pp. 24-32.

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