World-wide distributed testing for integrated circuits

Details World-wide distributed testing for integrated circuits World-wide distributed testing for integrated circuits

2007-03-06

2007-03-06

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Including multiple test instruments

C702S117000, C702S118000, C702S119000, C702S120000, C702S182000, C702S188000, C709S226000

Reexamination Certificate

active

10902231

ABSTRACT:
An integrated circuit test method is provided that utilizes shared tester resources physically located at different geographical sites throughout the world to test specific integrated circuits, thereby maximizing utilization of all tester resources and, thereby, dramatically reducing the overall cost to test.

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patent: 6028439 (2000-02-01), Arkin et al.
patent: 6557128 (2003-04-01), Turnquist
patent: 7113883 (2006-09-01), House et al.

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