Wiring test structures for determining open and short...

Details Wiring test structures for determining open and short... Wiring test structures for determining open and short...

2007-03-06

2007-03-06

Hirshfeld, Andrew (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C257S048000, C257S018000, C257S751000, C324S754120, C324S765010, C324S763010

Reexamination Certificate

active

11163450

ABSTRACT:
A wiring test structure includes a plurality of wiring traces configured in an interleaving spiral pattern. At least one of the plurality of wiring traces configured for open circuit testing therein, and at least a pair of the plurality of wiring traces is configured for short circuit testing therebetween.

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