Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Patent
1996-10-29
1999-02-02
Barlow, John
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
364488, 364491, G06F 1900
Patent
active
058678107
ABSTRACT:
A wiring device and wiring method suitable for designing LSIs or printed boards or the like. The wiring device includes a wiring pattern editing unit for editing wiring patterns; a noise analyzing unit for analyzing a noise occurring when a circuit is operated according to the wiring patterns edited by the wiring editing unit; and a noise occurring spot specifying unit for specifying a spot when noise occurs in the wiring pattern, based on the solution analyzed by the noise analyzing unit and the wiring pattern edited in the wiring pattern editing unit The man-hours of an operator can be reduced by interlocking the crosstalk noise analysis with the wiring pattern editing function and then by reducing the number of man-hours needed to correct a wiring pattern by an operator.
REFERENCES:
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patent: 5249134 (1993-09-01), Oka
patent: 5282146 (1994-01-01), Aihara et al.
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patent: 5618744 (1997-04-01), Suzuki et al.
patent: 5642286 (1997-06-01), Yamada et al.
patent: 5657242 (1997-08-01), Sekiyama et al.
Iida Kazuyuki
Katsuyama Yumiko
Miura Hiroshi
Yamada Ryoji
Yamashita Yasuhiro
Barlow John
Bui Bryan
Fujitsu Limited
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