Optics: measuring and testing – Position or displacement – Position transverse to viewing axis
Reexamination Certificate
2007-10-30
2007-10-30
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Position or displacement
Position transverse to viewing axis
C356S138000, C356S139030, C356S139100, C356S147000, C356S614000, C250S559290, C250S559380, C382S151000, C438S016000, C414S935000
Reexamination Certificate
active
10356684
ABSTRACT:
A wireless substrate-like sensor is provided to facilitate alignment and calibration of semiconductor processing systems. The wireless substrate-like sensor includes an optical image acquisition system that acquires one or more images of targets placed within the semiconductor processing system. Analysis of images of the targets obtained by the wireless substrate-like sensor provides position and/or orientation information in at least three degrees of freedom. An additional target is affixed to a known location within the semiconductor processing system such that imaging the reference position with the wireless substrate-like sensor allows the measurement and compensation for pick-up errors.
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Gardner DelRae H.
Huntzinger Greg
Lassahn Jeffrey K.
Ramsey Craig C.
CyberOptics Semiconductors, Inc.
Stock, Jr. Gordon J.
Toatley , Jr. Gregory J.
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