Communications: electrical – Condition responsive indicating system – Specific condition
Reexamination Certificate
2005-02-28
2008-07-15
Mullen, Thomas (Department: 2612)
Communications: electrical
Condition responsive indicating system
Specific condition
C324S765010, C340S010100
Reexamination Certificate
active
07400255
ABSTRACT:
Wirelessly testing an RFID tag before it is packaged or otherwise entered into a process reserved for “working” RFID tags is described. Various processes that employ such wireless testing as well as various “on-die” RFID tag antenna designs for facilitating the wireless testing are also described.
REFERENCES:
patent: 4495628 (1985-01-01), Zasio
patent: 4495629 (1985-01-01), Zasio
patent: 4912709 (1990-03-01), Teske et al.
patent: 4969148 (1990-11-01), Nadeau-Dostie et al.
patent: 5003204 (1991-03-01), Cushing et al.
patent: 5053700 (1991-10-01), Parrish
patent: 5130568 (1992-07-01), Miller et al.
patent: 5254942 (1993-10-01), D'Souza et al.
patent: 5257223 (1993-10-01), Dervisoglu
patent: 5355369 (1994-10-01), Greenberger et al.
patent: 5648661 (1997-07-01), Rostoker et al.
patent: 5689517 (1997-11-01), Ruparel
patent: 5831330 (1998-11-01), Chang
patent: 6070252 (2000-05-01), Xu et al.
patent: 6104291 (2000-08-01), Beauvillier et al.
patent: 6122762 (2000-09-01), Kim
patent: 6137155 (2000-10-01), Seshan et al.
patent: 6236223 (2001-05-01), Brady et al.
patent: 6249227 (2001-06-01), Brady et al.
patent: 6357025 (2002-03-01), Tuttle
patent: 6380729 (2002-04-01), Smith
patent: 6404684 (2002-06-01), Arimoto et al.
patent: 6412086 (2002-06-01), Friedman et al.
patent: 6412786 (2002-07-01), Pan
patent: 6426904 (2002-07-01), Barth et al.
patent: 6525410 (2003-02-01), Geisomini et al.
patent: 6563751 (2003-05-01), Wu
patent: 6566736 (2003-05-01), Ogawa et al.
patent: 6666380 (2003-12-01), Suzuya
patent: 6727722 (2004-04-01), Whetsel
patent: 6774470 (2004-08-01), Yagi et al.
patent: 6806494 (2004-10-01), Fenner et al.
patent: 6838773 (2005-01-01), Kikuchi et al.
patent: 6865701 (2005-03-01), Youngs et al.
patent: 6888365 (2005-05-01), Ma et al.
patent: 6930499 (2005-08-01), Van Arendonk et al.
patent: 6962827 (2005-11-01), Furue et al.
patent: 6982190 (2006-01-01), Roesner
patent: 7023347 (2006-04-01), Arneson et al.
patent: 7119567 (2006-10-01), Ma et al.
patent: 2002/0094596 (2002-07-01), Higuchi
patent: 2002/0094639 (2002-07-01), Reddy
patent: 2002/0125546 (2002-09-01), Muta
patent: 2005/0083203 (2005-04-01), Surkau
patent: 2005/0155213 (2005-07-01), Eastin
patent: 2005/0212674 (2005-09-01), Desmons et al.
patent: 2005/0240369 (2005-10-01), Diorio et al.
patent: 2005/0241146 (2005-11-01), Hamburgen
patent: 2006/0038687 (2006-02-01), White et al.
patent: 2006/0125505 (2006-06-01), Glidden et al.
patent: 2006/0125506 (2006-06-01), Hara et al.
patent: 2006/0125507 (2006-06-01), Hyde et al.
patent: 2006/0145710 (2006-07-01), Puleston et al.
Impinj, Inc., Products,How RFID Works, pp. 2, printed Apr. 30, 2004, www.impinj.com/products/rfid/applications.php.
Impinj, Inc.,Self-Adaptive Silicon, pp. 7, printed Apr. 30, 2004, www.impinj.com/technology/index.php.
Jarwala, N.,Designing Dual Personality IEEE 1149.1 Compliant Multi-Chip Modules, 1994, IEEE International Test Conference, paper 19.3, pp. 446-455.
Oakland, S.,Considerations for Implementing IEEE 1149.1 on System-on-a-Chip Integrated Circuits, Test Conference, 2000, Proceedings International, Oct. 3-5, pp. 628-637.
Levitt, M., et al.,Testability, Debuggability, and Manufacturability Features of the UltraSPARCTM-I Microprocessor, 1995, International Test Conference, paper 6.2, pp. 157-166.
Wood, S., et al.,A 5 GB/s 9-Port Application Specific SRAM with Built-in Self Test, 1995 International Workshop on Memory Technology, Design and Testing, Aug. 7-8, pp. 68-73.
Yurash, S., et al.,Automatic Test Pattern Generation Comes of Age, Electronic Engineering, vol. 63, No. 777, Sep. 1991, London GB, pp. 35-36 & 38.
Eichelberger, E.B., et al.,A Logic Design Structure for LSI Testability, Reprinted from the Proceedings of the 14th Design Automation Conference by the Institute of Electrical and Electroincs Engineers, Inc., pp. 206-212 (1997).
Youngs, L., et al.,Design of the UltraSPARCTM-I Microprocessor for Manufacturing performance, pp. 179-186, SPIE vol. 2874, Texas Instruments, Inc., Stafford, Texas, USA, assessed Mar. 8, 2004.
Atmel,IEEE 1149.1-1990 Standard Test Access Port Boundary Scan, 1900 IEEE Standard 1149.1, pp. 6, Sep. 1999.
John D. Hyde, “Wafer Level Testing for RFID Tags”, U.S. Appl. No. 11/014,523, filed Dec. 15, 2004, Final Office Action mailed May 1, 2007. The Final Office Action and a copy of the claims as they were presented to the PTO in response to the Final Office Action.
Dennis Kiyoshi Hara, “RFID Tag With BIST Circuits”, U.S. Appl. No. 11/014,076, filed Dec. 15, 2004, Notice of Allowance mailed Jun. 28, 2007. Notice of Allowance, and a copy of the claims as allowed.
Robert M. Glidden, “RFID Tag Design With Circuitry for Wafer Level Testing”, U.S. Appl. No. 11/014,075, filed Dec. 15, 2004, Notice of Allowance mailed Aug. 24, 2007. Notice of Allowance, and a copy of the claims as allowed.
Andrew E. Horch, “On Die RFID Tag Antenna”, U.S. Appl. No. 11/069,005, filed Feb. 28, 2005, Final Office Action mailed May 9, 2007. The Final Office Action and a copy of the claims as they were presented to the PTO in response to the Final Office Action.
Blakely , Sokoloff, Taylor & Zafman LLP
Impinj, Inc.
Mullen Thomas
LandOfFree
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