Wireless functional testing of RFID tag

Communications: electrical – Condition responsive indicating system – Specific condition

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S765010, C340S010100

Reexamination Certificate

active

07400255

ABSTRACT:
Wirelessly testing an RFID tag before it is packaged or otherwise entered into a process reserved for “working” RFID tags is described. Various processes that employ such wireless testing as well as various “on-die” RFID tag antenna designs for facilitating the wireless testing are also described.

REFERENCES:
patent: 4495628 (1985-01-01), Zasio
patent: 4495629 (1985-01-01), Zasio
patent: 4912709 (1990-03-01), Teske et al.
patent: 4969148 (1990-11-01), Nadeau-Dostie et al.
patent: 5003204 (1991-03-01), Cushing et al.
patent: 5053700 (1991-10-01), Parrish
patent: 5130568 (1992-07-01), Miller et al.
patent: 5254942 (1993-10-01), D'Souza et al.
patent: 5257223 (1993-10-01), Dervisoglu
patent: 5355369 (1994-10-01), Greenberger et al.
patent: 5648661 (1997-07-01), Rostoker et al.
patent: 5689517 (1997-11-01), Ruparel
patent: 5831330 (1998-11-01), Chang
patent: 6070252 (2000-05-01), Xu et al.
patent: 6104291 (2000-08-01), Beauvillier et al.
patent: 6122762 (2000-09-01), Kim
patent: 6137155 (2000-10-01), Seshan et al.
patent: 6236223 (2001-05-01), Brady et al.
patent: 6249227 (2001-06-01), Brady et al.
patent: 6357025 (2002-03-01), Tuttle
patent: 6380729 (2002-04-01), Smith
patent: 6404684 (2002-06-01), Arimoto et al.
patent: 6412086 (2002-06-01), Friedman et al.
patent: 6412786 (2002-07-01), Pan
patent: 6426904 (2002-07-01), Barth et al.
patent: 6525410 (2003-02-01), Geisomini et al.
patent: 6563751 (2003-05-01), Wu
patent: 6566736 (2003-05-01), Ogawa et al.
patent: 6666380 (2003-12-01), Suzuya
patent: 6727722 (2004-04-01), Whetsel
patent: 6774470 (2004-08-01), Yagi et al.
patent: 6806494 (2004-10-01), Fenner et al.
patent: 6838773 (2005-01-01), Kikuchi et al.
patent: 6865701 (2005-03-01), Youngs et al.
patent: 6888365 (2005-05-01), Ma et al.
patent: 6930499 (2005-08-01), Van Arendonk et al.
patent: 6962827 (2005-11-01), Furue et al.
patent: 6982190 (2006-01-01), Roesner
patent: 7023347 (2006-04-01), Arneson et al.
patent: 7119567 (2006-10-01), Ma et al.
patent: 2002/0094596 (2002-07-01), Higuchi
patent: 2002/0094639 (2002-07-01), Reddy
patent: 2002/0125546 (2002-09-01), Muta
patent: 2005/0083203 (2005-04-01), Surkau
patent: 2005/0155213 (2005-07-01), Eastin
patent: 2005/0212674 (2005-09-01), Desmons et al.
patent: 2005/0240369 (2005-10-01), Diorio et al.
patent: 2005/0241146 (2005-11-01), Hamburgen
patent: 2006/0038687 (2006-02-01), White et al.
patent: 2006/0125505 (2006-06-01), Glidden et al.
patent: 2006/0125506 (2006-06-01), Hara et al.
patent: 2006/0125507 (2006-06-01), Hyde et al.
patent: 2006/0145710 (2006-07-01), Puleston et al.
Impinj, Inc., Products,How RFID Works, pp. 2, printed Apr. 30, 2004, www.impinj.com/products/rfid/applications.php.
Impinj, Inc.,Self-Adaptive Silicon, pp. 7, printed Apr. 30, 2004, www.impinj.com/technology/index.php.
Jarwala, N.,Designing Dual Personality IEEE 1149.1 Compliant Multi-Chip Modules, 1994, IEEE International Test Conference, paper 19.3, pp. 446-455.
Oakland, S.,Considerations for Implementing IEEE 1149.1 on System-on-a-Chip Integrated Circuits, Test Conference, 2000, Proceedings International, Oct. 3-5, pp. 628-637.
Levitt, M., et al.,Testability, Debuggability, and Manufacturability Features of the UltraSPARCTM-I Microprocessor, 1995, International Test Conference, paper 6.2, pp. 157-166.
Wood, S., et al.,A 5 GB/s 9-Port Application Specific SRAM with Built-in Self Test, 1995 International Workshop on Memory Technology, Design and Testing, Aug. 7-8, pp. 68-73.
Yurash, S., et al.,Automatic Test Pattern Generation Comes of Age, Electronic Engineering, vol. 63, No. 777, Sep. 1991, London GB, pp. 35-36 & 38.
Eichelberger, E.B., et al.,A Logic Design Structure for LSI Testability, Reprinted from the Proceedings of the 14th Design Automation Conference by the Institute of Electrical and Electroincs Engineers, Inc., pp. 206-212 (1997).
Youngs, L., et al.,Design of the UltraSPARCTM-I Microprocessor for Manufacturing performance, pp. 179-186, SPIE vol. 2874, Texas Instruments, Inc., Stafford, Texas, USA, assessed Mar. 8, 2004.
Atmel,IEEE 1149.1-1990 Standard Test Access Port Boundary Scan, 1900 IEEE Standard 1149.1, pp. 6, Sep. 1999.
John D. Hyde, “Wafer Level Testing for RFID Tags”, U.S. Appl. No. 11/014,523, filed Dec. 15, 2004, Final Office Action mailed May 1, 2007. The Final Office Action and a copy of the claims as they were presented to the PTO in response to the Final Office Action.
Dennis Kiyoshi Hara, “RFID Tag With BIST Circuits”, U.S. Appl. No. 11/014,076, filed Dec. 15, 2004, Notice of Allowance mailed Jun. 28, 2007. Notice of Allowance, and a copy of the claims as allowed.
Robert M. Glidden, “RFID Tag Design With Circuitry for Wafer Level Testing”, U.S. Appl. No. 11/014,075, filed Dec. 15, 2004, Notice of Allowance mailed Aug. 24, 2007. Notice of Allowance, and a copy of the claims as allowed.
Andrew E. Horch, “On Die RFID Tag Antenna”, U.S. Appl. No. 11/069,005, filed Feb. 28, 2005, Final Office Action mailed May 9, 2007. The Final Office Action and a copy of the claims as they were presented to the PTO in response to the Final Office Action.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Wireless functional testing of RFID tag does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Wireless functional testing of RFID tag, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wireless functional testing of RFID tag will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3967432

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.