Thermal measuring and testing – Temperature measurement – Temperature distribution or profile
Patent
1996-02-23
1998-03-10
Gutierrez, Diego F. F.
Thermal measuring and testing
Temperature measurement
Temperature distribution or profile
374141, 374183, 73160, 219 6917, 36447404, G01K 114, G01K 1300, G01K 716, G01K 306
Patent
active
057253072
ABSTRACT:
A wire temperature measuring method for a wire electric discharge machine, by which temperature and temperature distribution of a wire can be accurately measured during electric discharge machining. After a machining voltage is cut off, a loop current flows. Based on the loop current and a voltage between electrodes measured by a differential amplifier, a resistance between the electrodes is obtained, and the temperature of a wire is obtained based on the resistance. Accordingly, the wire temperature during actual machining operation can be measured with accuracy.
REFERENCES:
patent: 4427870 (1984-01-01), Inoue
patent: 4474825 (1984-10-01), Schmidt
patent: 4675491 (1987-06-01), Marendaz
patent: 4801779 (1989-01-01), Obara
patent: 4825030 (1989-04-01), Demellayer
patent: 5346307 (1994-09-01), Ramirez et al.
Patent Abstracts of Japan, vol. 16, No. 203, 14 May 1992 (JP-A-04 030 916, published Feb. 3, 1992) Only abstract considered.
Ito Masaya
Kita Yuki
Obara Haruki
Fanuc Ltd.
Gutierrez Diego F. F.
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