Metal fusion bonding – Process – Plural joints
Reexamination Certificate
2005-03-08
2005-03-08
Edmondson, L. (Department: 1725)
Metal fusion bonding
Process
Plural joints
C228S004500
Reexamination Certificate
active
06863208
ABSTRACT:
In a wire-bonding process, a chip is provided with at least a first contact pad. A chip carrier is further provided with at least a second contact pad. A plurality of stacked conductive bumps are formed on the first contact pad. A conductive wire is formed by a reverse bonding process. The conductive wire electrically connects the second contact pad of the chip carrier to the stacked conductive bumps over the first contact pad of the chip.
REFERENCES:
patent: 5186381 (1993-02-01), Kim
patent: 5824569 (1998-10-01), Brooks et al.
patent: 6229222 (2001-05-01), Ohuchi
patent: 6285562 (2001-09-01), Zakel et al.
patent: 6561411 (2003-05-01), Lee
patent: 6602778 (2003-08-01), Manning et al.
patent: 20020158325 (2002-10-01), Yano et al.
patent: 20030205725 (2003-11-01), Masumoto et al.
Advanced Semiconductor Enigneering, Inc.
Edmondson L.
J.C. Patents
LandOfFree
Wire bonding process and wire bond structure does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Wire bonding process and wire bond structure, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wire bonding process and wire bond structure will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3430738