Wiping contacts

Details Wiping contacts Wiping contacts

1992-10-30

2000-03-14

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, G01R 1073

Patent

active

060377895

ABSTRACT:
Throughput and accuracy of testing of a semiconductor device is improved by forming the contacts to allow the leads of a packaged semiconductor device to pass through the contacts. Both AC and DC testing may be done because the contact length is substantially shortened.

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