Measuring and testing – Sampler – sample handling – etc. – Capture device
Reexamination Certificate
2008-12-22
2011-10-25
Williams, Hezron E (Department: 2856)
Measuring and testing
Sampler, sample handling, etc.
Capture device
Reexamination Certificate
active
08042414
ABSTRACT:
A wipe sampling assembly used for an ion mobility spectrometer is disclosed. The wipe sampling assembly comprises three layers in which the upper layer and the lower layer are protective paper sheets, while the middle layer is a sampling swab. The swab will not be contaminated when not in use as it is covered by the two protective paper sheets. The hand can only contact the protective paper and will not contact the swab while sampling to prevent the swab from being contaminated. The above wipe sampling assembly is used with no need for any additional device, thus making it easy to operate and carry.
REFERENCES:
patent: 3074276 (1963-01-01), Moos
patent: 4846167 (1989-07-01), Gordon et al.
patent: 4848167 (1989-07-01), Gordon et al.
patent: 5571976 (1996-11-01), Drolet
patent: 5814522 (1998-09-01), Zimmer et al.
patent: 5994149 (1999-11-01), Robinson et al.
patent: 6397690 (2002-06-01), Schroder et al.
patent: 2003/0113906 (2003-06-01), Sangha et al.
patent: 2563564 (2003-07-01), None
patent: 201181263 (2009-01-01), None
patent: 0 750 185 (1996-12-01), None
patent: 1 177 769 (2001-07-01), None
patent: 185 571 (1987-07-01), None
patent: 2 253 337 (1992-09-01), None
patent: 2005-189123 (2005-07-01), None
patent: WO 97/38294 (1997-10-01), None
patent: WO 00/76664 (2000-12-01), None
patent: WO 2006/038023 (2006-04-01), None
Chen Wei
Liu Jianhua
Peng Hua
Zhang Yangtian
Zhang Zhongxia
Kolb Nathaniel
Nuctech Company Limited
Westman Champlin & Kelly P.A.
Williams Hezron E
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