Wing-shaped support members for enhancing semiconductor...

Details Wing-shaped support members for enhancing semiconductor... Wing-shaped support members for enhancing semiconductor...

2011-01-18

2011-01-18

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S072500, C324S149000

Reexamination Certificate

active

07872486

ABSTRACT:
Example wing-shaped support members for enhancing semiconductor device probes and methods to form the same are disclosed. A disclosed example semiconductor device probe includes a finger having a first end and a second end. The example probe further includes a tip having a base and a pointed end. The base is joined to the first end of the finger and the tip tapers from the base to the pointed end. The probe also includes a support member on the tip to increase a rigidity of the tip.

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