Wien filter and electron microscope using same

Details Wien filter and electron microscope using same Wien filter and electron microscope using same

2005-01-18

2005-01-18

Lee, John R. (Department: 2881)

Radiant energy

Electron energy analysis

C250S3960ML

Reexamination Certificate

active

06844548

ABSTRACT:
A Wien filter is provided in which a less amount of secondary aberration is produced than conventional. This filter has 12 poles. These poles have front ends facing the optical axis. These front ends have a 12-fold rotational symmetry about the optical axis within the XY-plane perpendicular to the optical axis.

REFERENCES:
patent: 4962313 (1990-10-01), Rose
“Aberration Analysis of a Crossed-field Analyzer”, of Tian-Tong Tang,Optik 74, No. 2 (1986), pp. 51-56.
“Simulation of Electron Trajectories of Wien Filter for High-Resolution EELS Installed in TEM,”Katsushige Tsuno and John Rouse,J Electron Microsc 45, pp. 417-427 (1996).
“The retarding Wien filter as a high-performance imaging filter”, of H. Rose,Optik 77, No. 1 (1987), pp. 26-34.

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