Width-measuring method and surface texture measuring instrument

Details Width-measuring method and surface texture measuring instrument Width-measuring method and surface texture measuring instrument

2006-05-02

2006-05-02

Bennett, G. Bradley (Department: 2859)

Geometrical instruments

Gauge

Coordinate movable probe or machine

C033S551000

Reexamination Certificate

active

07036238

ABSTRACT:
A surface texture measuring instrument has a rotary table on which a workpiece is rotatably mounted, a Z-axis slider capable of moving in a Z-axis direction parallel to a rotation axis of the rotary table, an X-axis slider that is held by the Z-axis slider and is advanceable and retractable in an X-axis direction orthogonal to the rotation axis, a first arm that is held by the X-axis slider and is rotatable around a center line parallel to the X-axis, a second arm that is held by the first arm and is advanceable and retractable in a direction orthogonal to the X-axis, and a detector held by the second arm to measure a surface texture of the workpiece.

REFERENCES:
patent: 4097996 (1978-07-01), Yamazawa et al.
patent: 4155173 (1979-05-01), Sprandel
patent: 4903413 (1990-02-01), Bellwood
patent: 5813128 (1998-09-01), Bailey
patent: 6453730 (2002-09-01), Takemura
patent: 6854193 (2005-02-01), Lotze
patent: 2001/0008047 (2001-07-01), Okada et al.
patent: 2002/0170196 (2002-11-01), Takemura et al.
patent: 2005/0204571 (2005-09-01), Mies et al.
patent: 2001-343228 (2001-12-01), None

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