Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-09-23
2008-09-23
Barbee, Manuel L (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S072000
Reexamination Certificate
active
10855040
ABSTRACT:
A wideband signal analyzer has a plurality of frequency conversion paths for simultaneously processing different contiguous frequency bands of an input signal. Each frequency conversion path provides time domain data for input to a digital signal processor. The digital signal processor interpolates each group of time domain data to produce interpolated time domain data having a number of data points that satisfies a Nyquist condition for a combined bandwidth of the frequency conversion paths. A calibration signal set to a border frequency between a pair of frequency conversion channels is used to calibrate the gains and phase differences between the frequency conversion paths so that the digital signal processor identifies corresponding time domain data between the interpolated time domain data groups. A suite of frequency domain data is calculated by the digital signal processor from the interpolated time domain data groups and stored for subsequent display.
REFERENCES:
patent: 5659546 (1997-08-01), Elder
patent: 6154443 (2000-11-01), Huang et al.
patent: 6324559 (2001-11-01), Hellberg
patent: 6340883 (2002-01-01), Nara
patent: 6356067 (2002-03-01), Nara
patent: 6370133 (2002-04-01), Kang et al.
patent: 6380879 (2002-04-01), Kober et al.
patent: 6618434 (2003-09-01), Heidari-Bateni et al.
patent: 6980147 (2005-12-01), Mathis et al.
patent: 7010443 (2006-03-01), Torin et al.
patent: 2001/0000216 (2001-04-01), Kober et al.
patent: 2002/0080862 (2002-06-01), Ali
patent: 2004/0128076 (2004-07-01), Pupalaikis et al.
patent: 57091455 (1982-06-01), None
patent: 6034682 (1994-02-01), None
patent: 9166623 (1997-06-01), None
patent: 2000258477 (2000-09-01), None
patent: 2001228185 (2001-08-01), None
ATIS Committee T1A1, “Nyquist rate”, last generated Feb. 28, 2001; http://www.atis.org/tg2k/—nyquist—rate.html.
Agilent Technologies, Inc. “89600 Vector Signal Analyzers” Data Sheet May 28, 2003.
Barbee Manuel L
Gray Francis I.
Nelson Michael A.
Tektronix Inc.
LandOfFree
Wideband signal analyzer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Wideband signal analyzer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wideband signal analyzer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3916002